IRT Saint Exupéry • Technological Research Institute

Accelerating science, technology research & transfers to industry


645 documents

  • Hassan Hamad, Dominique Tournier, Jean-Michel Reynes, Olivier Perrotin, David Trémouilles, et al.. First results on 1.2 kV SiC MOSFET body diode robustness tests. Microelectronics Reliability, 2023, 151, pp.115264. ⟨10.1016/j.microrel.2023.115264⟩. ⟨hal-04282544⟩
  • Emilie Perret, Stéphanie Miot, Maxime Box, Raffaele D'Elia. PIÈCE CYLINDRIQUE À STRUCTURE SANDWICH, PROCÉDÉ DE FABRICATION D’UNE TELLE PIÈCE ET SON UTILISATION POUR LE STOCKAGE DE DÉCHETS RADIOACTIFS. France, N° de brevet: FR3115533A1. 2023. ⟨hal-04329451⟩
  • Agustin Martin Picard, Lucas Hervier, Thomas Fel, David Vigouroux. Influenciæ: A library for tracing the influence back to the data-points. 2023. ⟨hal-04284178⟩
  • M. Zerarka, V. Rustichelli, O. Perrotin, J.M. Reynes, David Trémouilles, et al.. New reliability model for power SiC MOSFET technologies under static and dynamic gate stress. Microelectronics Reliability, 2023, 150, pp.115190. ⟨10.1016/j.microrel.2023.115190⟩. ⟨hal-04298338⟩
  • Pierre Roumanille, Julien Lesseur, Julien Uzanu, Hoa Le Trong, Emna Ben Romdhane, et al.. Using X-ray imaging for the study of crack development in solder reliability testing. ESRF 2023, Oct 2023, TOULOUSE, France. pp.115079, ⟨10.1016/j.microrel.2023.115079⟩. ⟨hal-04273250⟩
  • Hassan Hamad, Dominique Tournier, Jean-Michel Reynes, Olivier Perrotin, Régis Meuret, et al.. First Results on 1.2 kV SiC MOSFET Body Diode Robustness Tests. 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2023, Toulouse, France. ⟨hal-04240602⟩
  • Erwann Kervennic, Thomas Louis, Michael Benguigui, Yves Bobichon, Nicolas Avaro, et al.. Embedded cloud segmentation using AI : Back on years of experiments in orbit on OPS-SAT. European Data Handling & Data Processing Conference 2023, European Space Agency (ESA), Oct 2023, Juan Les Pins, France. pp.1-8, ⟨10.23919/EDHPC59100.2023.10396625⟩. ⟨hal-04428379⟩
  • A. Chabert, M.C. Bakkay, Patrick Schweitzer, S. Weber, J. Andrea. A Transformer Neural Network For AC series arc-fault detection. Engineering Applications of Artificial Intelligence, 2023, 125, pp.106651. ⟨10.1016/j.engappai.2023.106651⟩. ⟨hal-04216553⟩
  • Juliette Mattioli, Xavier Le Roux, Bertrand Braunschweig, Loic Cantat, Fabien Tschirhart, et al.. AI engineering to deploy reliable AI in industry. AI4I, Sep 2023, Laguna Hill, CA, United States. ⟨hal-04224211⟩
  • Jean-Baptiste Sauveplane, C. Chabot, Catherine Ngom, M. Orsatelli, A. Guttierez-Galeano, et al.. Worst Case Heavy Ion Testing Conditions for Normally Off GaN-Based High Electron Mobility Transistor. European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2023, Toulouse, France. ⟨hal-04308661⟩

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