IRT Saint Exupéry • Technological Research Institute

Accelerating science, technology research & transfers to industry


664 documents

  • David Dupenne, Antoine Lonjon, Eric Dantras, Thierry Pierré, Marc Lubineau, et al.. Carbon fiber reinforced polymer metallization via a conductive silver nanowires polyurethane coating for electromagnetic shielding. Journal of Applied Polymer Science, 2020, pp.50146. ⟨10.1002/app.50146⟩. ⟨hal-03033572⟩
  • André Cabarbaye, Aurélien Cabarbaye, Alain Bensoussan, Olivier Gilard, Lip Sun How, et al.. Caractérisation de l’usure des composants électroniques et estimation de leur durée de fonctionnement avant défaillance (RUL : Remaining Useful Life). Congrès Lambda Mu 22 « Les risques au cœur des transitions » (e-congrès) - 22e Congrès de Maîtrise des Risques et de Sûreté de Fonctionnement, Institut pour la Maîtrise des Risques, Oct 2020, Le Havre (e-congrès), France. ⟨hal-03483537⟩
  • Téodolina Lopez, Al Bitar Ahmad, Sylvain Biancamaria, A. Güntner, A. Jäggi. On the Use of Satellite Remote Sensing to Detect Floods and Droughts at Large Scales. Surveys in Geophysics, 2020, 41 (6), pp.1461-1487. ⟨10.1007/s10712-020-09618-0⟩. ⟨hal-02976105⟩
  • Ahmad Berjaoui. Continual learning using hash-routed convolutional neural networks. 2020. ⟨hal-02961848⟩
  • Antoine Casadebaigt, Jonathan Hugues, Daniel Monceau. High temperature oxidation and embrittlement at 500–600 °C of Ti-6Al-4V alloy fabricated by Laser and Electron Beam Melting. Corrosion Science, 2020, 175, pp.108875. ⟨10.1016/J.CORSCI.2020.108875⟩. ⟨hal-03033588⟩
  • E. Ben Romdhane, A. Guédon-Gracia, S. Pin, P. Roumanille, H. Frémont. Impact of crystalline orientation of lead-free solder joints on thermomechanical response and reliability of ball grid array components. Microelectronics Reliability, 2020, pp.113812. ⟨10.1016/j.microrel.2020.113812⟩. ⟨hal-03011618⟩
  • Saliha Chetouani, Sébastien Serpaud, Alexandre Boyer, Sonia Ben Dhia. Fast and efficient approach to predict EMC immunity of complex equipment after a component change. EMC Europe 2020, Sep 2020, Rome (online), Italy. ⟨hal-02951845⟩
  • Quang Chuc Nguyen, Patrick Tounsi, Jean-Pierre Fradin, Jean-Michel Reynes. Investigation on the use of the MOSFET SiC body diode for junction temperature measurement. IEEE THERMINIC 2020, Fraunhofer Berlin, Sep 2020, Berlin, Germany. ⟨hal-03655865⟩
  • Alexandre Boyer, Sonia Ben Dhia, André Durier. A new Voltage Measurement Probe for investigating Radiated Immunity Test. EMC Europe 2020, Sep 2020, Rome (virtual), Italy. ⟨hal-02951842⟩
  • Hans Sathler, Bernardo Cougo, Jean-Pierre Carayon, François Costa, Denis Labrousse. Modeling of Common-Mode Voltage Source for Multilevel Inverter Topologies. 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Sep 2020, Rome, Italy. pp.1-3, ⟨10.1109/EMCEUROPE48519.2020.9245681⟩. ⟨hal-03266491⟩

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