IRT Saint Exupéry • Technological Research Institute

Accelerating science, technology research & transfers to industry


689 documents

  • E. Ben Romdhane, A. Guédon-Gracia, S. Pin, P. Roumanille, H. Frémont. Impact of crystalline orientation of lead-free solder joints on thermomechanical response and reliability of ball grid array components. Microelectronics Reliability, 2020, pp.113812. ⟨10.1016/j.microrel.2020.113812⟩. ⟨hal-03011618⟩
  • Saliha Chetouani, Sébastien Serpaud, Alexandre Boyer, Sonia Ben Dhia. Fast and efficient approach to predict EMC immunity of complex equipment after a component change. EMC Europe 2020, Sep 2020, Rome (online), Italy. ⟨hal-02951845⟩
  • Alexandre Boyer, Sonia Ben Dhia, André Durier. A new Voltage Measurement Probe for investigating Radiated Immunity Test. EMC Europe 2020, Sep 2020, Rome (virtual), Italy. ⟨hal-02951842⟩
  • Quang Chuc Nguyen, Patrick Tounsi, Jean-Pierre Fradin, Jean-Michel Reynes. Investigation on the use of the MOSFET SiC body diode for junction temperature measurement. IEEE THERMINIC 2020, Fraunhofer Berlin, Sep 2020, Berlin, Germany. ⟨hal-03655865⟩
  • Hans Sathler, Bernardo Cougo, Jean-Pierre Carayon, François Costa, Denis Labrousse. Modeling of Common-Mode Voltage Source for Multilevel Inverter Topologies. 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Sep 2020, Rome, Italy. pp.1-3, ⟨10.1109/EMCEUROPE48519.2020.9245681⟩. ⟨hal-03266491⟩
  • Anaïs Cassou, Quang Chuc Nguyen, Patrick Tounsi, Jean-Pierre Fradin, Marc Budinger, et al.. Extraction of compact transient thermal models for a global optimization of a power system based on SiC MOSFETs switches. 26th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC 2020), Sep 2020, Berlin, Germany. ⟨hal-03655834⟩
  • Nicolas C. Rouger, Yazan Barazi, Marc Cousineau, Frédéric Richardeau. Modular Multilevel SOI-CMOS Active Gate Driver Architecture for SiC MOSFETs. 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD), Sep 2020, Vienna (virtual ), Austria. pp.278-281, ⟨10.1109/ISPSD46842.2020.9170181⟩. ⟨hal-02920129⟩
  • Yazan Barazi, Nicolas C. Rouger, Frédéric Richardeau. CMOS Gate Driver with fast short circuit protection for SiC MOSFETs. 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD), Sep 2020, Vienna (virtual), Austria. pp.94-97, ⟨10.1109/ISPSD46842.2020.9170164⟩. ⟨hal-02920189⟩
  • T Hähner, P Rybsky, I Cotton, R Lowndes, L Albert, et al.. A Round-Robin Test Study of Partial Discharge Inception Voltage in Aeronautic Cables. 9th Internat. Symposium on Electrical Insulating Materials (ISEIM), Waseda University, Sep 2020, Tokyo, Japan. pp. 185-189. ⟨hal-03002958⟩
  • Plinio Bau, Marc Cousineau, Bernardo Cougo, Frédéric Richardeau, Nicolas C. Rouger. Modeling and Design of High Bandwidth Feedback Loop for dv/dt Control in CMOS AGD for GaN. 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD), Sep 2020, Vienna ( virtual ), Austria. pp.106-109, ⟨10.1109/ISPSD46842.2020.9170106⟩. ⟨hal-02920181⟩

Powered by HAL logo

Scroll to top