Publications

622 documents

Sami El Aabid, Christophe Turpin, Jérémi Régnier, N. Chadourne, J. d'Arbigny, et al.. Monitoring of ageing campaigns of PEM fuel cell stacks using model-based methods. 8th International Conference on Fundamentals & Development of Fuel Cells (FDFC 2019), Feb 2019, Nantes, France. ⟨hal-03877358⟩
A. Benyoucef, Laurent Berquez, Gilbert Teyssedre, Eddy Aubert. Addressing space charge issues in aeronautical DC cables. More Electrical Aircraft Congress, (MEA 2019) Toulouse, 06-07 Feb. 2019, Feb 2019, Toulouse, France. ⟨hal-02396326⟩
Marie Levêque, Sébastien Dutour, Marc Miscevic, Y. Bertin, Pascal Lavieille, et al.. Etude expérimentale et analyse du comportement thermique et hydrodynamique d’une boucle diphasique à pompage hybride capillaire et mécanique. 27ème Congrès Français de Thermique (SFT 2019), 3-6 juin 2019, Nantes (FRANCE), 2019, Nantes, France. ⟨hal-03953541⟩
Amin Oueslati, Philippe Cuenot, Julien Deantoni, Christophe Moreno. System Based Interference Analysis in Capella. The Journal of Object Technology, 2019, 18 (2), pp.14:1. ⟨10.5381/jot.2019.18.2.a14⟩. ⟨hal-02182902⟩
Camille Bessaguet, Eric Dantras, Guilhem Michon, Mathieu Chevalier, Lydia Laffont, et al.. Electrical behavior of a graphene/PEKK and carbon black/PEKK nanocomposites in the vicinity of the percolation threshold. Journal of Non-Crystalline Solids, 2019, 512, pp.1-6. ⟨10.1016/j.jnoncrysol.2019.02.017⟩. ⟨hal-02073556⟩
A. Durier, S. Ben Dhia, T. Dubois. Study of the Radiated Immunity of an Op-Amp Using Near Field Scan Immunity Method. Proceedings of EMC Compo, 2019, 2019, Hangzhou, China. ⟨hal-02515677⟩
A. Durier, S. Ben Dhia, T. Dubois. Study of the Coupling of Wide Band Near Field Scan Probe Dedicated to the Investigation of the Radiated Immunity of Printed Circuit Boards. Proceedings of SPI, 2019, 2019, Chambéry, France. ⟨hal-02515627⟩
A. Durier, S. Ben Dhia, T. Dubois. Comparison of Voltages Induced in an Electronic Equipment during Far Field and Near Field Normative Radiated Immunity Tests. Proceedings of EMC Europe, 2019, 2019, Barcelona, Spain. ⟨hal-02515648⟩
S. Pin, A. Gracia, J.-Y. Delétage, H. Fremont. Robustness of BGAs: Parametric study of voids' distribution in SAC solder joints. Microelectronics Reliability, 2019, ⟨10.1016/j.microrel.2019.113484⟩. ⟨hal-02515004⟩
Manuel A González-Sentís, Patrick Tounsi, Alain Bensoussan, Arnaud Dufour. Drift effects and trap analysis of power-GaN-HEMT under switching power cycling. Science of Electronics, Technologies of Information and Telecommunication, SETIT’18, Dec 2018, Hammamet, Tunisia. ⟨hal-02131990⟩

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