IRT Saint Exupéry • Technological Research Institute

Accelerating science, technology research & transfers to industry


645 documents

  • Timothée Jammot, Elsy Kaddoum, Serge Rainjonneau. Planification de vidage d'images satellitaires par systèmes multi-agents auto-adaptatifs. 26èmes Journées Francophones sur les Systèmes Multi-Agents (JFSMA 2018), Oct 2018, Métabief, Doubs, France. pp.1-10. ⟨hal-03613749⟩
  • Jean-Paul Bodeveix, Arnaud Dieumegard, M Filali. Event-B Formalization of a Variability-Aware Component Model Patterns Framework. 15th International Conference on Formal Aspects of Component Software (FACS 2018), Oct 2018, Pohang, South Korea. pp.54-74, ⟨10.1007/978-3-030-02146-7_3⟩. ⟨hal-02181895⟩
  • Chaimae Ghfiri, Alexandre Boyer, André Durier, Sonia Ben Dhia. A new methodology to build the Internal Activity Block of ICEM-CE for complex Integrated Circuits. IEEE Transactions on Electromagnetic Compatibility, 2018, 60 (5), pp.1500-1509. ⟨10.1109/TEMC.2017.2767084⟩. ⟨hal-01659770⟩
  • Philippe Besse, Brendan Guillouet, Béatrice Laurent. Wikistat 2.0: Ressources pédagogiques pour l'Intelligence Artificielle. 2018. ⟨hal-01883120v2⟩
  • Bernardo Cougo, Thierry Meynard, Guillaume Gateau, Lenin Morais. Zero Sequences Optimizing Different Criteria for Three-Phase Multilevel Inverters. 2018 IEEE Energy Conversion Congress and Exposition (ECCE), Sep 2018, Portland, United States. pp.7243-7250, ⟨10.1109/ECCE.2018.8557898⟩. ⟨hal-02403659⟩
  • Nicolas Jean Laurent Bello, Céline Larignon, Simon Pérusin, Joël Douin. Study of the evolution of two Al-Cu-(Li) alloys during thermal ageing. International Microscopy Congress 2018, Sep 2018, Sydney, Australia. ⟨hal-02056252⟩
  • Yuanci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Nicolas Chadourne, et al.. Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications. Microelectronics Reliability, 2018, 88-90, pp.1231 - 1235. ⟨10.1016/j.microrel.2018.07.038⟩. ⟨hal-01892422⟩
  • J.D. Aguirre Morales, F. Marc, A. Bensoussan, A. Durier. Simulation and modelling of long term reliability of digital circuits implemented in FPGA. Microelectronics Reliability, 2018, 88-90, pp.1130-1134. ⟨10.1016/j.microrel.2018.07.151⟩. ⟨hal-01946442⟩
  • Omar Chihani, Loïc Théolier, Alain Bensoussan, Jean-Yves Delétage, André Durier, et al.. Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses. Microelectronics Reliability, 2018, 88-90, pp.402-405. ⟨10.1016/j.microrel.2018.07.076⟩. ⟨hal-02499971⟩
  • Karim Elayoubi, Angélique Rissons, Aniceto Belmonte. Optical test bench experiments for 1-Tb/s satellite feeder uplinks. Laser Communication and Propagation through the Atmosphere and Oceans VII, Aug 2018, San Diego, United States. pp.1-12, ⟨10.1117/12.2317728⟩. ⟨hal-01902684⟩

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