645 documents

  • T. Rousselin, G. Hubert, D. Regis, M. Gatti, A. Bensoussan. Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies. Microelectronics Reliability, 2017, 76-77, pp.159-163. ⟨10.1016/j.microrel.2017.07.078⟩. ⟨hal-01633598⟩
  • Yinghui Yin, Amangeldi Torayev, Caroline Gaya, Youcef Mammeri, Alejandro A. Franco. Linking the Performances of Li-O-2 Batteries to Discharge Rate and Electrode and Electrolyte Properties through the Nucleation Mechanism of Li2O2. Journal of Physical Chemistry C, 2017, 121 (36), pp.19577-19585. ⟨10.1021/acs.jpcc.7b05224⟩. ⟨hal-03611046⟩
  • Alix Bernot, Alexandre Giraud, Yvan Lefèvre, Jean-François Llibre. Experimental Study of Iron Losses Generated by a Uniform Rotating Field. IEEE Transactions on Magnetics, 2017, 53 (11), pp.6300705. ⟨10.1109/TMAG.2017.2707542⟩. ⟨hal-01652370⟩
  • Anne Castelan, Bernardo Cougo, Sébastien Dutour, Thierry A. Meynard. Plate fin heat sink analytical modeling for fast and precise optimization. Journées ISP3D-2017 "Intégration des Systèmes de Puissances en 3D" du GDR-CNRS SEEDS, 15-16 mars 2017, Toulouse (FRANCE), 2017, Toulouse, France. ⟨hal-03937351⟩
  • Camille Bessaguet, Eric Dantras, Colette Lacabanne, Mathieu Chevalier, Guilhem Michon. Piezoelectric and mechanical behavior of NaNbO3/PEKK lead-free nanocomposites. Journal of Non-Crystalline Solids, 2017, 459, pp.83-87. ⟨10.1016/j.jnoncrysol.2016.12.030⟩. ⟨hal-01481093⟩
  • S. Hairoud, G. Duchamp, T. Dubois, J. Y. Delétage, A. Durier, et al.. A conducted Immunity Model for Electromagnetic Reliability of a Voltage Reference Circuit. Microelectronics Reliability, 2017. ⟨hal-02515280⟩
  • Pedro Rynkiewicz, Anne-Laure Franc, F. Coccetti, M. Wietstruck, M. Kaynak, et al.. 2nd and 4th order planar dual-mode ring filters at 140 GHz in CMOS 130 nm technology. 2017 Asia Pacific Microwave Conference (APMC), Nov. 13-16, 2017, Kuala Lumpur (MALAYSIA), 2017, Kuala Lumpur, Malaysia. pp.132-135. ⟨hal-03878158⟩
  • Cédric Abadie, T. Billard, Sorin Dinculescu, Thierry Lebey. On-line Non Intrusive PDs' Measurements on Aeronautical Systems. International Symposium on Electrical Insulating Materials (ISEIM), Sept. 11-15, 2017, Toyohashi (JAPAN), 2017, Toyohashi, Japan. pp.99-103, ⟨10.23919/ISEIM.2017.8088698⟩. ⟨hal-03965926⟩
  • Léonard Serrano, Philippe Olivier, Jacques Cinquin. Compaction Behavior Of Out-of-Autoclave Prepreg Materials. Inconnu, 2017. ⟨hal-04064753⟩
  • Joseph B Bernstein, Alain Bensoussan, Emmanuel Bender, Joseph B Bernstein. Open Archive TOULOUSE Archive Ouverte (OATAO) Reliability prediction with MTOL. Microelectronics Reliability, 2017, 68, pp.91-97. ⟨10.1016/j.microrel.2016.09.005⟩. ⟨hal-01622781⟩
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