IRT Saint Exupéry • Technological Research Institute

Accelerating science, technology research & transfers to industry


662 documents

  • Duc-Hoan Tran, Bernardo Cougo, Rodrigo Drummond, Israel Divan, Gilles Segond. Modeling and measurement of high frequency temperature variation on GaN transistors for inverter and rectifier applications. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05387731⟩
  • Duc Hoan Tran, Bernardo Cougo, Rodrigo Drummond, Israel Divan, Gilles Segond. Modeling and measurement of high frequency temperature variation on GaN transistors for inverter and rectifier applications. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05323107⟩
  • Ababacar Diouf, Valeria Rustichelli, Loris Pace, Emmanuel Marcault, Maroun Alam, et al.. Aging of p-GaN gate HEMTs under hard-switching conditions. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05323081⟩
  • Thomas Vadebout, Pascal Bevilacqua, Valeria Rustichelli, Maroun Alam, Laurence Allirand, et al.. Permanent degradation of p-GaN HEMTs due to repetitive overvoltage stress during hard turn-off switching. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05323111⟩
  • Rodrigo Drummond, Bernardo Cougo, Duc-Hoan Tran. Application-representative high-frequency power cycling of SiC power modules used in inverters and rectifiers. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05323085⟩
  • Bernardo Cougo, Israel Divan, Duc-Hoan Tran, Lenin Martins Ferreira Morais, Victor Araujo, et al.. Influence of high frequency power cycles on SiC power module lifetime under automotive mission profile. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05387706⟩
  • Corentin Friedrich, Andrés Lombana, Jérôme Fasquel, Charlie Schlick, Nora Bennani, et al.. CoFmuPy: A Python Framework for Rapid Prototyping of FMI-based Digital Twins. The 2nd International Conference on Engineering Digital Twins, Oct 2025, Grand Rapids, Michigan, USA, United States. ⟨hal-05326255v2⟩
  • James Hainsworth, Adriana Morana, Lucas Lescure, Philippe Veyssiere, Sylvain Girard, et al.. Numerical and Experimental Study of Mode Coupling Due to Localised Few-Mode Fibre Bragg Gratings and a Spatial Mode Multiplexer. Sensors, 2025, 25 (19), pp.6087. ⟨10.3390/s25196087⟩. ⟨hal-05306150⟩
  • Gregory Almeida, Sebastien Serpaud, Victor Dos Santos, Bernardo Cougo, Fabio Coccetti. Methodology for Parasitic Elements Extraction of SiC Power Module Based on N-Port Measurement. IEEE Transactions on Power Electronics, 2025, 40 (10), pp.14962-14973. ⟨10.1109/TPEL.2025.3570619⟩. ⟨hal-05228480⟩
  • Luca Mossina, Corentin Friedrich. Conformal Prediction for Image Segmentation Using Morphological Prediction Sets. Medical Image Computing and Computer Assisted Intervention – MICCAI 2025, Sep 2025, Daejeon, South Korea. pp.78-88, ⟨10.48550/arXiv.2503.05618⟩. ⟨hal-04984192⟩

Powered by HAL logo

Scroll to top