IRT Saint Exupéry • Technological Research Institute

Accelerating science, technology research & transfers to industry


733 documents

  • Ludovic Barriere, Clément Laboulfie, Sébastien Bocquet. Approches de quantification d'incertitudes pour l'évaluation de la crédibilité des simulations. 17ème Colloque National en Calcul des Structures, CSMA, May 2026, Giens, France. ⟨hal-05631859⟩
  • Sébastien Bocquet, Stéphanie Miot, Ludovic Barriere, Florent Grotto, Clément Laboulfie. Une librairie open source pour la démonstration de crédibilité des simulations et la qualification/certification par analyse supportée par essais. 17ème Colloque National en Calcul des Structures, CSMA, May 2026, Giens, France. ⟨hal-05631864⟩
  • Antonio Peña Corredor, Julien Lesseur, Romain Nunez, Paul Rivalland, Thomas Philippe. Interpretable Computer Vision for Defect Detection in X-ray Tomography of Aerospace SiC/SiC Composites. 2026. ⟨hal-05614123⟩
  • Ryma Boumazouza, Raya Elsaleh, Melanie Ducoffe, Shahaf Bassan, Guy Katz. FAME: Formal Abstract Minimal Explanation for Neural Networks. The International Conference on Learning Representations (ICLR) 2026, Apr 2026, Rio de janeiro, Brazil. ⟨10.48550/arXiv.2603.10661⟩. ⟨hal-05583283⟩
  • Grégoire Dhimoïla, Thomas Fel, Victor Boutin, Agustin Picard. CROSS-MODAL REDUNDANCY AND THE GEOMETRY OF VISION-LANGUAGE EMBEDDINGS. International Conference on Learning Representations, Apr 2026, Rio de Janeiro (BRAZIL), Brazil. ⟨10.48550/arXiv.2602.06218⟩. ⟨hal-05608789⟩
  • Mickaël Leicht, Baptiste Arati, Gautier Girard, Alexandre Marie, Aymeric Lagadec, et al.. Thermal shock simulations of a PCB with embedded components and microvia based interconnection: meso-scale modeling of the woven composite. 27th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2026), Apr 2026, Varsovie, Poland. pp.1-8, ⟨10.1109/EuroSimE69483.2026.11511998⟩. ⟨hal-05625758⟩
  • Dennis Wanyoike, Alexandre Boyer, Sébastien Serpaud. Near-field scanning based extraction of the equivalent coupling surface for an emi filter component on a pcb and comparison with the tem cell. 22eme colloque international et exposition sur la Compatibilité Électromagnétique, l’Institut XLIM, Apr 2026, LIMOGES, France. ⟨hal-05597877⟩
  • Thomas Vadebout, Pascal Bevilacqua, Valeria Rustichelli, Maroun Alam, Laurence Allirand, et al.. Permanent degradation of p-GaN HEMTs due to repetitive overvoltage stress during hard turn-off switching. Microelectronics Reliability, 2026, 178, pp.116024. ⟨10.1016/j.microrel.2026.116024⟩. ⟨hal-05507060⟩
  • Arthur Piat, Sami Hlioui, Pierre-Étienne Lévy, François Costa, Sébastien Serpaud. Impedance Variations in Random Wound Coils of Synchronous Motors: A Statistical Approach. IEEE Transactions on Energy Conversion, 2026, 41 (1), pp.262-271. ⟨10.1109/TEC.2025.3597834⟩. ⟨hal-05584253⟩
  • M.L. Dedew, Stéphane Lefebvre, T.A. Nguyen, T.L. Le, V. Rustichelli, et al.. Failure mechanisms of GaN HEMTs in single event destructive short-circuit at different VDS voltage levels. Microelectronics Reliability, 2026, 179, pp.116059. ⟨10.1016/j.microrel.2026.116059⟩. ⟨hal-05542753⟩

Powered by HAL logo

Scroll to top