Tuesday February 23rd, 2016 - Deep submicron (DSM) Day

08:30    Opening.
Jean-François Rouchon, Director, INP-Enseeiht
Ariel Sirat, Director, IRT Saint Exupéry
Patrick Désiré, Director, Aerospace Valley

Introduction. Alain Bensoussan, NanoRun2016 Chair, IRT Saint Exupéry

09:00    FIDES and PISTIS programmes – Charles Le Coz (Thales Global Services, Vélizy), Jean-Claude Clément (Thales Group, Palaiseau, France)

09:40    ST65nm hardened ASIC technology for Space applications – Laurent Hili (ESA microelectronics section, Noordwijk, The Netherlands), Florence Malou (Cnes, Toulouse, France), Philippe Roche & Yves Gilot (STMicroelectronics, Grenoble)

10:20    Coffee break

10:50    Deep submicron reliability issues at CEA Leti – Xavier Garros (CEA Leti, Grenoble, France)

11:20    Why Weibull?… Why not! – Prof. Joseph Bernstein (Ariel University, Israël)

12:30    Lunch on

14:00    Advanced 28 nm UTBB FDSOI CMOS technology in harsh environment impacts and reliability investigation – Philippe Galy, Philippe Roche & Vincent Huard (ST Microelectronics, Grenoble, France)

14:40    Reliability prediction based on multiple accelerated life tests – Prof. Joseph Bernstein (Ariel University, Israël)

Wednesday February 24th, 2016 - GaN Day

09:00    Multiple stress generalised reliability model – Alain Bensoussan (IRT Saint Exupéry, Toulouse, France)

09:30    GaN technology for space application: needs, constraints and perspectives – Christian Elisabelar and Christian Rouzies (CNES, Toulouse, France)

10:00    Coffee break

10:30    GaN technology for high reliability applications – Dr. Alex Lidow, CEO, (EPC Corp., Los Angeles, USA)

12:30    Lunch on

14:00    E²CoGaN project – Energy efficient converters using GaN power devices – Olivier Crepel (Airbus Group Innovations, Toulouse, France)

14:30    GaN roadmap at Zodiac Aerospace – Thierry Rouge Carrassat (Zodiac Aerospace, Plaisir, France)