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IRT Saint Exupéry PhD student wins best paper award at global conference on embedded electronics

Chaimae Ghfiri who is PhD student in the second year, was awarded the prize for best paper at the 2016 7th Asia-Pacific International Electromagnetic Compatibility and Signal Integrity Symposium (APEMC) which took place in Shenzhen, China between 18 and 21 May. This exceptional performance recognises the talent of a young researcher. It also highlights a…

An IRT Saint Exupéry PhD student won the best presentation Award at the PhD School GEET

Warm congratulations to Cédric Abadie (More Electrical Aircraft Domain) who has won The Best Presentation Prize, awarded by the PhD School GEET (Electrical Engineering, Electronics & Telecommunications). His thesis is titled, « Partial discharges characterization in an aeronautical system ». It is framed by IRT Saint Exupéry and the Laplace. The presentation dealt with the influence of pressure variation on the nature of partial…

More than 100 participants to NanoRun2016, its 1st international forum on nanoscale microelectronics

NanoRun 2016 brought together more than 100 nanoscale runners, representatives from more than 20 industries and 20 research agencies, centres and laoratories. This 1st IRT Saint Exupéry Nanoscale Runners International Forum promoted disruptive technologies in interdisciplinary technics and understanding of Space, Aeronautical, Ground Transportation, Energy and Environment, or Telecommunication Systems. From February 23 to 24 on…

An IRT Saint Exupéry team won the Virtual Engineering Award #ERTS2016

Emilie Rouland, Philippe Cuenot and Eric Jenn, research engineers at IRT Saint Exupéry, with Eric Faure and Nicolas Broueilh from ASTC Design Partners, received the ERTS2 conference award in the field of virtual engineering for their paper “An Experiment is Exploiting Virtual Platforms for the Development of Embedded Equipments“. This paper a system hardware co-development approach taking…

IRT Saint Exupéry at the European Symposium on Reliability of Electron Devices and Failure Physics

ESREF 2015, the 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis will take place in Toulouse (France) from 5th to 9th October 2015. This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a…

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