IRT Saint Exupéry • Technological Research Institute

Accelerating science, technology research & transfers to industry


661 documents

  • Zoé Borius, Antoine Débarre, Marc Singlard, Frédéric Laurin, Thierry Cutard, et al.. Influence of tow-preg composition on microstructure and mechanical behaviour of oxide/oxide CMCs. Composites Part B: Engineering, 2026, 310, pp.113133. ⟨10.1016/j.compositesb.2025.113133⟩. ⟨hal-05338491⟩
  • Léo Andéol, Luca Mossina, Adrien Mazoyer, Sébastien Gerchinovitz. Conformal Object Detection by Sequential Risk Control. 2025. ⟨hal-05399935⟩
  • Thibaut Boissin, Thomas Massena, Franck Mamalet, Mathieu Serrurier. Turbo-Muon: Accelerating Orthogonality-Based Optimization with Pre-Conditioning. 2025. ⟨hal-05390446⟩
  • Thomas Massena, Corentin Friedrich, Franck Mamalet, Mathieu Serrurier. Fast and Flexible Robustness Certificates for Semantic Segmentation. 2025. ⟨hal-05393092⟩
  • T. Bonneval, M. Lanoy, R. Tanays, L. Sanches, G. Michon, et al.. Dispersion analysis in a 3D lattice elastic waveguide for the design of an absolute filter. Journal of Sound and Vibration, 2025, 617, pp.119314. ⟨10.1016/j.jsv.2025.119314⟩. ⟨hal-05228003⟩
  • Nicolas Boizard, Hippolyte Gisserot-Boukhlef, Duarte M. Alves, André F T Martins, Ayoub Hammal, et al.. EuroBERT: Scaling Multilingual Encoders for European Languages. COLM 2025 - Second Conference on Language Modeling, Oct 2025, Montreal, Canada. pp.1-28. ⟨hal-05226285⟩
  • Duc Hoan Tran, Bernardo Cougo, Rodrigo Drummond, Israel Divan, Gilles Segond. Modeling and measurement of high frequency temperature variation on GaN transistors for inverter and rectifier applications. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05323107⟩
  • Ababacar Diouf, Valeria Rustichelli, Loris Pace, Emmanuel Marcault, Maroun Alam, et al.. Aging of p-GaN gate HEMTs under hard-switching conditions. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05323081⟩
  • Mohamed Lemine Dedew, Stéphane Lefebvre, Tien Anh Nguyen, Thanh Long Le, Valeria Rustichelli, et al.. Failure Mechanisms of GaN HEMTs in Single Event Destructive Short-Circuit at Different VDS Voltage Levels. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05323097⟩
  • Duc-Hoan Tran, Bernardo Cougo, Rodrigo Drummond, Israel Divan, Gilles Segond. Modeling and measurement of high frequency temperature variation on GaN transistors for inverter and rectifier applications. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05387731⟩

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