IRT Saint Exupéry • Technological Research Institute

Accelerating science, technology research & transfers to industry


647 documents

  • Zoé Borius, Antoine Débarre, Marc Singlard, Frédéric Laurin, Thierry Cutard, et al.. Influence of tow-preg composition on microstructure and mechanical behaviour of oxide/oxide CMCs. Composites Part B: Engineering, 2026, 310, pp.113133. ⟨10.1016/j.compositesb.2025.113133⟩. ⟨hal-05338491⟩
  • T. Bonneval, M. Lanoy, R. Tanays, L. Sanches, G. Michon, et al.. Dispersion analysis in a 3D lattice elastic waveguide for the design of an absolute filter. Journal of Sound and Vibration, 2025, 617, pp.119314. ⟨10.1016/j.jsv.2025.119314⟩. ⟨hal-05228003⟩
  • Nicolas Boizard, Hippolyte Gisserot-Boukhlef, Duarte M. Alves, André F T Martins, Ayoub Hammal, et al.. EuroBERT: Scaling Multilingual Encoders for European Languages. COLM 2025 - Second Conference on Language Modeling, Oct 2025, Montreal, Canada. pp.1-28. ⟨hal-05226285⟩
  • Thomas Vadebout, Pascal Bevilacqua, Valeria Rustichelli, Maroun Alam, Laurence Allirand, et al.. Permanent degradation of p-GaN HEMTs due to repetitive overvoltage stress during hard turn-off switching. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05323111⟩
  • Ababacar Diouf, Valeria Rustichelli, Loris Pace, Emmanuel Marcault, Maroun Alam, et al.. Aging of p-GaN gate HEMTs under hard-switching conditions. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05323081⟩
  • Mohamed Lemine Dedew, Stéphane Lefebvre, Tien Anh Nguyen, Thanh Long Le, Valeria Rustichelli, et al.. Failure Mechanisms of GaN HEMTs in Single Event Destructive Short-Circuit at Different VDS Voltage Levels. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05323097⟩
  • Rodrigo Drummond, Bernardo Cougo, Duc-Hoan Tran. Application-representative high-frequency power cycling of SiC power modules used in inverters and rectifiers. ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France. ⟨hal-05323085⟩
  • Corentin Friedrich, Andrés Lombana, Jérôme Fasquel, Charlie Schlick, Nora Bennani, et al.. CoFMPy: A Python Framework for Rapid Prototyping of FMI-based Digital Twins. The 2nd International Conference on Engineering Digital Twins, Oct 2025, Grand Rapids, Michigan, USA, United States. ⟨hal-05326255⟩
  • James Hainsworth, Adriana Morana, Lucas Lescure, Philippe Veyssiere, Sylvain Girard, et al.. Numerical and Experimental Study of Mode Coupling Due to Localised Few-Mode Fibre Bragg Gratings and a Spatial Mode Multiplexer. Sensors, 2025, 25 (19), pp.6087. ⟨10.3390/s25196087⟩. ⟨hal-05306150⟩
  • Gregory Almeida, Sebastien Serpaud, Victor Dos Santos, Bernardo Cougo, Fabio Coccetti. Methodology for Parasitic Elements Extraction of SiC Power Module Based on N-Port Measurement. IEEE Transactions on Power Electronics, 2025, 40 (10), pp.14962-14973. ⟨10.1109/TPEL.2025.3570619⟩. ⟨hal-05228480⟩

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